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P6245 P6243 有源FET探头

P6245是美国Tektronix公司专为500M和500M以上示波器设计的、最大可达1.5GHz有源FET探头产品。该产品能够满足超过1GHz的带宽的测试要求,能够直接进行间距大于0.5mm的SMD测试,特别适合于高速信号采集、低电路负载的测量场合。

   性能特点:
   □ 精巧的探头设计,能够直接进行间隔大于0.5mm的SMD测试;
   □ 能进行CMOS、BiCMOS、ECL、GaAS和TTL逻辑;
   □ 组合式结构:使用更加灵活,能够适应更多的测试场合;
   □ TekProbeTM BNC接口支持,能自动被示波器识别,直接被示波器供电;
   □ 符合多种安全标准:UL3111-1、CSA1010.1、ENG61010-2-031。

   技术参数:
   □ 带宽:1.5GHz(典型值,仅指探头);
   □ 衰减比:10×;
   □ 输入阻抗:输入电阻=1MΩ,输入电容<1pF;
   □ 补偿电容:8~12Pf;
   □ 最大电压:±15V(DC+PkAC);
   □ 直流补偿范围:10V;
   □ 传输延迟:5.3ns±200ps;
   □ 电缆长:1.3米;

   应用领域
   □ 兼容的示波器产品:TDS3000、TDS3000B、TDS500、TDS600、TDS700;
   □ 高速数字电路设计;
   □ 组件设计、分析;
   □ 教学研究;
   □ 生产制造、测试

P6245
P6243

Applications

P6245 and P6243 Active Probes for TEKPROBE BNC Interfaces

P6245

The P6245 Active FET probe achieves high-speed signal acquisition by solving three traditional problems:

The P6245 and P6243 Active probes provide the electrical and mechanical performance required for today's digital systems designs. No additional power supplies or cables are required when used with TEKPROBE BNC oscilloscopes. Both the P6245 and P6243 achieve high-speed signal acquisition and low circuit loading, required for solving today's problems faced by designers.

The small compact probe head and versatile attachment accessories allow direct connection to the device under test.

The P6245 and P6243 Active Probes provide scope bandwidth at the probe tip for the TDS500/600/700; the P6243 provides scope bandwidth at the probe tip for the TDS3000 Series scope up to 1 GHz bandwidth.

1* Some TDS6000 or TDS7000 oscilloscopes require a TCA-BNC adapter.

P6243

The P6243 Active FET probe is the high performance probing solution for 500 MHz oscilloscopes. The P6243 has a probe only bandwidth of 1 GHz and will provide a 500 MHz system bandwidth when used with Tektronix' full line of 500 MHz oscilloscopes. In addition, the P6243 is powered by the TEKPROBE BNC interface, eliminating the need for additional power supplies and cables when used with TEKPROBE BNC oscilloscopes.

The P6243 offers superior signal acquisition on surface mount devices compared to the much higher capacitive loading of passive probes. The P6243 has ≤1 pF capacitive loading which allows it to measure high speed signals without affecting the signal or device under test. Furthermore, the included accessories and adapters allow for easy attachment to SMDs.


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